Electron Microscopy
Unique concept based on ISO methodology
Fully automatic and semi automatic inspection
Digital control of all components
User friendly, powerful and highly adaptive software
Windows™ based operating system
Scanning Electron Microscope

Until today, your choice of affordable, easy-to-use high-resolution imaging tools was limited. With our electron microscope you are able to view on the submicron and nano scale.
Our personal scanning electron microscope (SEM) helps you see beyond the limits of optical.
With 20 times the magnification of a conventional light microscope, the SEM combines high resolution imaging with extreme ease-of-use. Engineers, researchers, educators and students can make high-quality sub-micron images with as little as 10 minutes of training.
The system is ideal for detailed imaging of sub-micron particles, fibers, microtools, electronic components and more. The optical camera, motorized stage and touch-screen user interface work together to help you easy navigate to a region of interest from a 24X "bird's eye view".
Superb image quality will help create new ways to ramp up production and speed up the time to root cause analysis.
We propose you a high-resolution personal scanning electron microscope with an optical camera for never-lost navigation. Its innovative touch-screen user interface and control knob let you quickly produce high-quality electron microscope images with minimal training. The system can handle a wide range of samples with minimal preparation and are loaded instantly with our patented low vacuum load-lock technology. Images are saved on a USB memory stick or network storage location for off-line analysis, measurements and distribution.
Specifications

- Magnification range 24 - 24,000X
- Images up to 2048 x 2048 pixels
- Resolution up to 30 nm
- Sample loading in less than 30 seconds
- Total weight 55 kg (120 lbs)
- Automated sample control
- Very low energy consumption
Detailed specifications
| System | Imaging module, 17" touch screen monitor, rotary knob, diaphragm vacuum pump, power supply, USB 2.0 flash drive |
Imaging Modes
|
Magnification fixed: 24X Magnification range: 120X to 24,000X Digital zoom: max. 12X |
Digital Image Detection
|
Color CCD camera High sensitivity backscatter electron detector (compositional and topographical modes) |
| Image Format | JPEG, TIFF, BMP |
| Image Resolution Options | 456 x 456, 684 x 684, 1024 x 1024 and 2048 x 2048 pixels |
| Data Storage | USB 2.0 flash drive |
| Sample Stage | Computer controlled motorized X and Y |
| Sample Size | 25 mm (dia) x 30 mm (h) |
Sample Loading Time
|
< 5 s < 30 s |
Dimensions & Weight
|
286 (w) x 566 (d) x 495 (h) mm, 50 kg 145 (w) x 220 (d) x 213 (h) mm, 4.5 kg 156 (w) x 300 (d) x 74 (h) mm, 3 kg 375 (w) x 203 (d) x 395 (h) mm, 4.6 kg |
| Room Temperature | 15°C ~ 30°C (59°F ~ 86°F) |
| Humidity | <80%RH |
| Power | Single phase AC 110 - 240 Volt, 50/60 Hz, 300 W (max.) |
| Recommended Table Size | 120 x 75 cm, load rating of 100 kg |

Featuring a breath-taking touch screen user interface that provides never lost navigation, Scanning Electron Microscope provides high throughput with only 30 seconds to data and is extremely easy to use.
Its design ensures it can handle a wide range of samples with minimal preparation and samples are loaded instantly with patented vacuum technology. High resolution electron and optical images are saved on a USB memory stick for off-line analysis, measurements and distribution.
Images and applications
| Biology | |||
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| Head of a fruit fly | Dandelion | Bacteria on a Si filter | Butterfly egg |
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| Diatoms | Diatom | Wing of a butterfly | Wood pores |
| Materials Science | |||
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| Clinker | Concrete | Inside of an egg shell | Metal filter |
| Technics and Electronics | |||
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| Bond pad | Laser marking | Metal balls | Metal lines |
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| Microelectronic structure | Microelectronic structure | Microelectronic structure | Semiconductor |
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| Cross section solar cell | Surface solar cell | Semiconductor | Semiconductor |

























