TopIR
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The TopIR is an original FTIR accessory developed to support a wide range of diffuse reflectance applications. To make measurements, simply place large, solid samples face down onto the top plate of the accessory. Powders can be placed into a appropriate sampling cup at the top of the instrument. A mask set is included for the analysis of small solids such as gems and precious stones.
This design is outstandingly suitable for mid-IR analysis of coatings on metallic surfaces of large or small samples.
Since the sampling area of the TopIR is above the plane of the FTIR instrument, even large samples that do not fit into the sample compartment can be analyzed with this accessory.
Features
- Analysis of powders, ground solid samples and coatings on metallic surfaces;
- Out-of-compartment design for analysis of large samples;
- High optical output and excellent signal-to-noise ratio;
- Micrometer-controlled sample stage positioning and focusing;
- Pre-aligned, fixed-position optical components for reproducible, high-quality data;
- Optional gold-coated optics version for highest performance mid-IR and NIR applications.

